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8/10/2019 05 - Weber
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superior performance.powerful technology.
SuperPower, Inc. is a subsidiary of Royal Philips Electronics N.V.
Transmission Level HTS Fault CurrentLimiter
Chuck Weber
8 th
Annual EPRI Superconductivity ConferenceOak Ridge, TNNovember 12, 2008
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8 th Annual EPRI Superconductivity Conference November 12, 2008
SFCL program overview
15.248"
7.362"
15.248"
7.362"
138 kV, 650 kV BILBushings
Vacuum Vessel
Pressure Vessel
Matrix Assembly
Inner diameter
InnerHeight
HTS AssemblyHeight
Assembly diameter
Partners
Specifications
YBCO based, resistive type FCL
138 kV class device
Fault Current
13.8 kA
Load Current
1,200 A rms
Design fault current
37 kA
Design device response
Recover
to superconducting state after a faultcarrying full load current
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TIDD Substation
(Partial) One-Line Diagram
Proposed SFCLInstallationLocation
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Prior accomplishments
Proof-of-Concept demonstrated
MCP 2212 (2004)
2G YBCO (2006)
Beta device testing specificationsestablished
Completed design and testing of HV
bushings (SEI)
Investigated several engineered 2Garchitectures for improved RUL
Design and laboratory testing of shuntcoils to withstand high fault transient loads
Thermal simulation of RUL process
Weibull
plots of standard 2G failures
Conceptual CRS & vessel design
Investigated LN 2 dielectric properties
2G FCL - Probability of failure for 2G tapes as function of energyinput
0.01
0.1
1
10
100
20 25 30 35 40 45 50
Energy [J/cm/tape]
P r o
b a
b i l i t y o
f f a i l u r e
[ % ]
Probability of Failure - Test dataProbability of Failure Calculated using Weibull Distributuon
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Improvements to shunt coil and contact design
Shunt coil improvements:
Manufacturing improvements
(easier assembly, more robustcoil)
Mechanical strength
Multi-Layer winding (sizereduction)
Connector improvements:
Shape optimization to avoidcontact hotspots
Improvement in RUL Time
Improvement in RUL Current
Improvement in consistency ofcontact resistance
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Tape heating near contact during fault impactsRUL
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Correlation between different contact geometries
Total Current (80A peak)
Recovery Voltage
Superconductors Current
Straight Thick Contacts
(M3-460 Tape):
I load
= 80 ARUL = 82 sec.
Total Current (80A peak)
Recovery Voltage
SuperconductorsCurrent
Total Current (80A peak)
Recovery Voltage
SuperconductorsCurrent
Straight -Tapered Contacts(M3-460 Tape):
I load
= 80 ARUL =
3.5 sec.
Straight -Tapered Contacts
(M3-460 Tape):
I load
= 80 ARUL = 2.8 sec.
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Recent KEMA tests
Recent rounds of KEMA testing focused on critical AEP reclosure sequence onan HTS element
Straight elements wereused
Improved connectordesigns were used
Standard, pre-qualifiedtapes were used
Test Dates: May 2008,July 2008
5 Cycles
Fault13kA/7kA
18 Cycles
Load Current
15 sec
Load Current135 secLoad Current
5 CyclesFault
13kA/7kA
5 CyclesFault
13kA/7kA
5 CyclesFault
13kA/7kABreaker opensand locks-out
Recovery under
NO Load Current
5 Cycles
Fault13kA/7kA
160 secLoad Current
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2G RUL capabilities tested at KEMA
Standard SF12100 2G wire used
Test conditions
-
37 kA fault
-
follows AEP sequence
Test variables
-
Shunt impedance
-
Number of parallel tapes
-
System voltage (v/cm/tape)
-
Load Current
16 Tapes8 Tapes
4 Tapes100V
200V
250V
300V
0
50000
100000
150000
200000
250000
Load Powe r (VA)
Total Recovered Pow er, 2x5 cycles Faults at 37kA with 10mOhm
P a r a l l e l T a p e s
V o l t a
g e
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3 x Base-Line Voltage
w/o Load
w/ Load
Achieving RUL is a difficult task
Without load current recovery is very fast
Adding load current makesrecovery much more difficult
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Base-Line Voltage
RUL
1.5 x Base-Line Voltage
RUL
3 x Base-Line Voltage
RUL
Electrical stress on the tapes can limit RUL
RUL time can affected byincreasing the V/cm on thetape
Limits of the designoptimization are understood
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Factors impacting RUL defined by test results
1.67 m-Ohm
5 m-Ohm
100 V200 V
250 V300 V
0
10000
20000
30000
40000
50000
60000
70000
80000
Load Power (VA))
Total Recovered Power, 2x5 cycles Faults at 37kA with 4 Tapes
S h u n t I m p e d a n c e V o l t a g
e
Sample surface plot of RUL conditions
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Ability to predict RUL over wide design space
1 . 6
7 m - O
h m
5 m - O
h m
4 T a p e s ,
1 0 0 V
4 T a p e s ,
2 5 0 V
8 T a p e s ,
1 0 0 V
8 T a p e s ,
2 5 0 V
1 6 T a p e s ,
1 0 0 V
1 6 T a p e s , 2 5
0 V
0
100
200
300
400
500
600
700
800
900
1000
Maximun RecoveredLoad Current
Recovered Current with 2 Asymmetrical 37kA Faults, 5 cycles each
I m p e d a n c e V o l t
a g e, # T a p e s
Maximum Load Current as a function of shunt impedance, operating
voltage & number oftapes
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RUL with 90% of the Power recovered withinthe 2 nd
and the 3 rd
37 kA Faults
Worst case conditions at Tidd
can achieve RUL
Full recovery expected with optimal bath conditions
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Bath Conditions Impact on Ability to Recover
100 150 200 250 300 350 400 450 500 5500
100
200
300
400
500
600
Heat OutHeat In
No Recovery Due to Film Boiling
Temperature (K)
P o w e r
( W )
Lowering the shunt coil value orincreasing the resistance of thestabilizer layer will help with film boiling.
Lower Z shunt
,Higher Z
tape
Boiling Heat Transfer for LN2
0.1
1.0
10.0
100.0
1.0 10.0 100.0 1000.0
T wall - T sat (K)
q / A ( W / c m
2 )
During the fault transient, tape heats up to film boiling region.Bath conditions (pressure, subcooling) shift boiling heat transfer curveBath conditions have an impact on the dielectric strength of LN2
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19 Managed by UT-Battellefor the Department of Energy DOE Peer Review 2008
Introducing bubbles in LN lowersbreakdown strength: FCL recovery
Two experiments
Open bath LN
Pressurized cryostat
Nitrogen gas provided
by fused silica capillarytube
Varied flow rates
Parallel plane profiledSS electrodes
BD strength of LN is
~5x the gas at 1 bar
Bubbles form thermally or electrically and can affect the breakdown strength
2 mm gap0.5 mm capillary tube
Important for FCL Recovery under Load
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Effect of externally provided bubbleson LN Breakdown: AC breakdown
all data w and w/o bubbles
Breakdown Field (kVrms/mm)5 6 7 8 9 20 3010
C u m u
l a t i v e
F a
i l u r e
P r o
b a
b i l i t y ( % )
1.0
5.0
10.0
20.030.040.050.060.070.080.090.095.0
99.099.9
Effect of Bubbles
Presence of bubbleswithout bubbles with bubbles
A v e r a g e
E l e c t r i c
F i e l d ( k V r m s / m m
)
0
2
4
6
8
10
12
14
16
18
Liquid nitrogen at 1 bar
Bubbles in LN lowers breakdown strength
Change in slope at lower probability indicates change in BDmechanism
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Summary
Significant progress in understanding and impacts of:
RUL
Variables impacting RUL studied and understood
Worst case conditions at TIDD can be met
Impact of device design and cost under evaluation
LN2
Dielectrics
Impact of bubbles on breakdown mechanism and dielectricstrength
Loss of cryogenic partner a setback, but not fatal
Next step: Alpha detailed design
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8 th Ann l EPRI S percond cti it Conference No ember 12 2008
Thank You for your attention!
For more information:
www.superpower-inc.com